Omnyx is an advanced manufacturing test platform for printed circuit board assemblies (PCBAs) and sub-assemblies used in AI and data center hardware. By integrating structural, parametric, high-speed interconnect, and operational testing within a single platform, Omnyx enables manufacturers to test both assembly integrity and system performance earlier in the manufacturing process.
As AI and data center architectures evolve, PCBAs and sub-assemblies are becoming increasingly complex and valuable. Conventional in-circuit test (ICT) methods primarily detect structural and parametric defects introduced during assembly. However, many issues affecting modern high-performance systems, including signal integrity and operational faults only appear under high-speed or mission-mode conditions.
By expanding test coverage beyond traditional ICT, Omnyx enables manufacturers to detect these defects at the component and sub-assembly stage before final system integration. This approach helps reduce defect escapes, improve end-of-line yield, and ensure the quality and reliability required for today’s high-performance data center infrastructure.
Expanded Test Coverage
Combines structural, parametric, high-speed interconnect, and operational testing in a unified platform
Earlier Defect Detection
Identifies signal integrity and performance issues at the component and sub-assembly stage
Improved Yield and Quality
Reduces defect escapes and improves final system reliability
Optimized for AI and Data Center Hardware
Designed for complex, high-performance compute architectures
Scalable Manufacturing
Supports economically scalable production for next-generation infrastructure
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Automation: No-touch high-speed conveyance, SMEMA ready
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Test System: Synchronized Analog and Digital Subsystems
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Compatible Test Architecture: Single site, multi-site and large format
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Pin Capacity: 2,560–10,000+ pins
