{"product_id":"teradyne-omnyx-advanced-test-platform-for-ai-and-data-center-hardware-manufacturing","title":"Teradyne OMNYX - Advanced test platform for AI and data center hardware manufacturing","description":"\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-6\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003eOmnyx is an advanced manufacturing test platform for printed circuit board assemblies (PCBAs) and sub-assemblies used in AI and data center hardware. By integrating structural, parametric, high-speed interconnect, and operational testing within a single platform, Omnyx enables manufacturers to test both assembly integrity and system performance earlier in the manufacturing process.\u003c\/p\u003e\n\u003cp\u003e \u003c\/p\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003ch2 class=\"lazyloaded\"\u003eOverview\u003c\/h2\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp data-start=\"697\" data-end=\"1105\"\u003eAs AI and data center architectures evolve, PCBAs and sub-assemblies are becoming increasingly complex and valuable. Conventional in-circuit test (ICT) methods primarily detect structural and parametric defects introduced during assembly. However, many issues affecting modern high-performance systems, including signal integrity and operational faults only appear under high-speed or mission-mode conditions.\u003c\/p\u003e\n\u003cp data-start=\"1107\" data-end=\"1457\"\u003eBy expanding test coverage beyond traditional ICT, Omnyx enables manufacturers to detect these defects at the component and sub-assembly stage before final system integration. This approach helps reduce defect escapes, improve end-of-line yield, and ensure the quality and reliability required for today’s high-performance data center infrastructure.\u003c\/p\u003e\n\u003cp data-start=\"1107\" data-end=\"1457\"\u003e \u003c\/p\u003e\n\u003cdiv class=\"vc_row wpb_row vc_inner vc_row-fluid\"\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-12\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003ch2\u003eAdvantages\u003c\/h2\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"vc_row wpb_row vc_inner vc_row-fluid\"\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-4\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element bullet\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003e\u003cstrong\u003eExpanded Test Coverage\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eCombines structural, parametric, high-speed interconnect, and operational testing in a unified platform\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-4\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element bullet\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003e\u003cstrong\u003eEarlier Defect Detection\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eIdentifies signal integrity and performance issues at the component and sub-assembly stage\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-4\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element bullet\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003e\u003cstrong\u003eImproved Yield and Quality\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eReduces defect escapes and improves final system reliability\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"vc_row wpb_row vc_inner vc_row-fluid\"\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-4\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element bullet\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003e\u003cstrong\u003eOptimized for AI and Data Center Hardware\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eDesigned for complex, high-performance compute architectures\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-4\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element bullet\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003e\u003cstrong\u003eScalable Manufacturing\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eSupports economically scalable production for next-generation infrastructure\u003c\/p\u003e\n\u003cp\u003e \u003c\/p\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003ch2\u003eTechnical Specifications\u003c\/h2\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"1\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003eAutomation:\u003cspan\u003e \u003c\/span\u003e\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003eNo-touch high-speed conveyance, SMEMA ready\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"2\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003eTest System:\u003cspan\u003e \u003c\/span\u003e\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003eSynchronized Analog and Digital Subsystems\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"3\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003eCompatible Test Architecture\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003e: Single site, multi-site and large format\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"4\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003ePin Capacity\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003e: 2,560–10,000+ pins\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"5\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003ePCB Footprint\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003e: 900x750mm\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"6\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003ePCB Weight\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003e: 15kg\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"Teradyne","offers":[{"title":"Default Title","offer_id":53217224229161,"sku":null,"price":0.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0738\/4665\/3225\/files\/Teradyne-Omnyx-030526-short.webp?v=1780064743","url":"https:\/\/assembly-products.com\/products\/teradyne-omnyx-advanced-test-platform-for-ai-and-data-center-hardware-manufacturing","provider":"Assembly Products","version":"1.0","type":"link"}