{"title":"Teradyne Inline Platforms Built for Modern Manufacturing","description":"\u003cdiv data-vc-full-width=\"true\" data-vc-full-width-init=\"true\" class=\"vc_row wpb_row vc_row-fluid background2 vertical-padding white-text\"\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-12\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"vc_row wpb_row vc_inner vc_row-fluid\"\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-12\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element text-center\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003eTeradyne’s inline test systems automate high-coverage printed circuit board assembly (PCBA) testing. TestStation and Omnyx provide scalable test solutions that support a wide range of requirements, from structural defect detection to advanced coverage for complex hardware.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","products":[{"product_id":"teradyne-omnyx-advanced-test-platform-for-ai-and-data-center-hardware-manufacturing","title":"Teradyne OMNYX - Advanced test platform for AI and data center hardware manufacturing","description":"\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-6\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003eOmnyx is an advanced manufacturing test platform for printed circuit board assemblies (PCBAs) and sub-assemblies used in AI and data center hardware. By integrating structural, parametric, high-speed interconnect, and operational testing within a single platform, Omnyx enables manufacturers to test both assembly integrity and system performance earlier in the manufacturing process.\u003c\/p\u003e\n\u003cp\u003e \u003c\/p\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003ch2 class=\"lazyloaded\"\u003eOverview\u003c\/h2\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp data-start=\"697\" data-end=\"1105\"\u003eAs AI and data center architectures evolve, PCBAs and sub-assemblies are becoming increasingly complex and valuable. Conventional in-circuit test (ICT) methods primarily detect structural and parametric defects introduced during assembly. However, many issues affecting modern high-performance systems, including signal integrity and operational faults only appear under high-speed or mission-mode conditions.\u003c\/p\u003e\n\u003cp data-start=\"1107\" data-end=\"1457\"\u003eBy expanding test coverage beyond traditional ICT, Omnyx enables manufacturers to detect these defects at the component and sub-assembly stage before final system integration. This approach helps reduce defect escapes, improve end-of-line yield, and ensure the quality and reliability required for today’s high-performance data center infrastructure.\u003c\/p\u003e\n\u003cp data-start=\"1107\" data-end=\"1457\"\u003e \u003c\/p\u003e\n\u003cdiv class=\"vc_row wpb_row vc_inner vc_row-fluid\"\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-12\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003ch2\u003eAdvantages\u003c\/h2\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"vc_row wpb_row vc_inner vc_row-fluid\"\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-4\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element bullet\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003e\u003cstrong\u003eExpanded Test Coverage\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eCombines structural, parametric, high-speed interconnect, and operational testing in a unified platform\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-4\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element bullet\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003e\u003cstrong\u003eEarlier Defect Detection\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eIdentifies signal integrity and performance issues at the component and sub-assembly stage\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-4\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element bullet\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003e\u003cstrong\u003eImproved Yield and Quality\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eReduces defect escapes and improves final system reliability\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"vc_row wpb_row vc_inner vc_row-fluid\"\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-4\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element bullet\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003e\u003cstrong\u003eOptimized for AI and Data Center Hardware\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eDesigned for complex, high-performance compute architectures\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_column vc_column_container vc_col-sm-4\"\u003e\n\u003cdiv class=\"vc_column-inner\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element bullet\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp\u003e\u003cstrong\u003eScalable Manufacturing\u003c\/strong\u003e\u003c\/p\u003e\n\u003cp\u003eSupports economically scalable production for next-generation infrastructure\u003c\/p\u003e\n\u003cp\u003e \u003c\/p\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003ch2\u003eTechnical Specifications\u003c\/h2\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"1\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003eAutomation:\u003cspan\u003e \u003c\/span\u003e\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003eNo-touch high-speed conveyance, SMEMA ready\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"2\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003eTest System:\u003cspan\u003e \u003c\/span\u003e\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003eSynchronized Analog and Digital Subsystems\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"3\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003eCompatible Test Architecture\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003e: Single site, multi-site and large format\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"4\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003ePin Capacity\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003e: 2,560–10,000+ pins\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"5\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003ePCB Footprint\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003e: 900x750mm\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cul\u003e\n\u003cli aria-setsize=\"-1\" data-leveltext=\"\" data-font=\"Symbol\" data-listid=\"1\" data-list-defn-props='{\"335552541\":1,\"335559685\":720,\"335559991\":360,\"469769226\":\"Symbol\",\"469769242\":[8226],\"469777803\":\"left\",\"469777804\":\"\",\"469777815\":\"multilevel\"}' data-aria-posinset=\"6\" data-aria-level=\"1\"\u003e\n\u003cb\u003e\u003cspan data-contrast=\"auto\"\u003ePCB Weight\u003c\/span\u003e\u003c\/b\u003e\u003cspan data-contrast=\"auto\"\u003e: 15kg\u003c\/span\u003e\u003cspan data-ccp-props=\"{}\"\u003e \u003c\/span\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"Teradyne","offers":[{"title":"Default Title","offer_id":53217224229161,"sku":null,"price":0.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0738\/4665\/3225\/files\/Teradyne-Omnyx-030526-short.webp?v=1780064743"},{"product_id":"teradyne-teststaion-inline-flexible-high-coverage-test-for-complex-pcb-assemblies","title":"Teradyne Teststaion Inline - Flexible high-coverage test for complex PCB assemblies","description":"\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element lazyloaded\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003ch4\u003e\u003cstrong\u003eTestStation Handler\u003c\/strong\u003e\u003c\/h4\u003e\n\u003cp data-start=\"197\" data-end=\"422\"\u003eThe TestStation Inline Handler with Multi-Site Test Insert delivers the speed of two parallel systems, reducing test time by 50%. It is ideal for high-mix, high-volume production where maximum test productivity is required.\u003c\/p\u003e\n\u003cp data-start=\"424\" data-end=\"626\"\u003eThe system can also be configured as a Single-Site Test System, with the second site added later in the field, providing\u003cspan\u003e \u003c\/span\u003e\u003cstrong data-start=\"545\" data-end=\"623\"\u003escalable capacity, flexible deployment, and optimized return on investment\u003c\/strong\u003e.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"ult-spacer spacer-6a170e89593d8\" data-id=\"6a170e89593d8\" data-height=\"25\" data-height-mobile=\"25\" data-height-tab=\"25\" data-height-tab-portrait=\"\" data-height-mobile-landscape=\"\"\u003e\u003cbr\u003e\u003c\/div\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003ch4\u003e\u003cstrong\u003eTestStation Handler Large Format\u003c\/strong\u003e\u003c\/h4\u003e\n\u003cp data-start=\"243\" data-end=\"542\"\u003eThe TestStation Inline Handler Large Format builds on the capabilities of the standard TestStation Handler, offering a more powerful automated test system. It supports both Single-Site and Multi-Site configurations and features the Test Insert Model 161, accommodating up to\u003cspan\u003e \u003c\/span\u003e\u003cstrong data-start=\"518\" data-end=\"539\"\u003e6,144 test points\u003c\/strong\u003e.\u003c\/p\u003e\n\u003cp data-start=\"544\" data-end=\"725\"\u003eThis system is ideal for manufacturers of large or complex PCBA assemblies such as server, datacom, or computer boards transitioning to an inline automated production environment.\u003c\/p\u003e\n\u003cp data-start=\"544\" data-end=\"725\"\u003e \u003c\/p\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003ch3\u003e\u003cstrong\u003eAdvantages\u003c\/strong\u003e\u003c\/h3\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp data-start=\"262\" data-end=\"617\"\u003eTestStation Automated Inline Handler and Large Format models integrate seamlessly with Multi-Site Test Inserts. They fit within standard line automation footprints with no additional space required. Multi-Site systems reduce excessive cabling between the Unit Under Test (UUT) and test instrumentation, helping maintain test accuracy and fault coverage.\u003c\/p\u003e\n\u003cp data-start=\"619\" data-end=\"804\"\u003eWith short setup times, rapid mechanical cycles, and robust capabilities, these handler systems help manufacturers\u003cspan\u003e \u003c\/span\u003e\u003cstrong data-start=\"734\" data-end=\"764\"\u003esave time and reduce costs\u003c\/strong\u003e\u003cspan\u003e \u003c\/span\u003eby automating production efficiently.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"ult-spacer spacer-6a170e8959a00\" data-id=\"6a170e8959a00\" data-height=\"10\" data-height-mobile=\"10\" data-height-tab=\"10\" data-height-tab-portrait=\"\" data-height-mobile-landscape=\"\"\u003e\u003cbr\u003e\u003c\/div\u003e\n\u003cdiv class=\"ult-spacer spacer-6a170e8959a0c\" data-id=\"6a170e8959a0c\" data-height=\"10\" data-height-mobile=\"10\" data-height-tab=\"10\" data-height-tab-portrait=\"\" data-height-mobile-landscape=\"\"\u003e\u003cbr\u003e\u003c\/div\u003e\n\u003cdiv class=\"ult-spacer spacer-6a170e8959a16\" data-id=\"6a170e8959a16\" data-height=\"10\" data-height-mobile=\"10\" data-height-tab=\"10\" data-height-tab-portrait=\"\" data-height-mobile-landscape=\"\"\u003e\u003cbr\u003e\u003c\/div\u003e\n\u003cdiv class=\"ult-spacer spacer-6a170e8959a1f\" data-id=\"6a170e8959a1f\" data-height=\"10\" data-height-mobile=\"10\" data-height-tab=\"10\" data-height-tab-portrait=\"\" data-height-mobile-landscape=\"\"\u003e\u003cbr\u003e\u003c\/div\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003ch3\u003e\u003cstrong\u003eFeatures \u0026amp; Options\u003c\/strong\u003e\u003c\/h3\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cul\u003e\n\u003cli\u003eSeamless integration with TestStation Test Inserts\u003c\/li\u003e\n\u003cli\u003eShort setup time, automatic fixture feed, and interlocking mechanisms\u003c\/li\u003e\n\u003cli data-start=\"972\" data-end=\"1031\"\u003eFlexible and scalable within the TestStation architecture\u003c\/li\u003e\n\u003cli data-start=\"1034\" data-end=\"1090\"\u003eCompatible with large boards and expandable pin counts\u003c\/li\u003e\n\u003cli data-start=\"1093\" data-end=\"1132\"\u003eAuto-Width or Manual-Width adjustment\u003c\/li\u003e\n\u003cli data-start=\"1135\" data-end=\"1198\"\u003eAnti-static conveyor and optional barcode scanner integration\u003c\/li\u003e\n\u003cli data-start=\"1201\" data-end=\"1242\"\u003eEasy maintenance and serviceable design\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003ca href=\"https:\/\/www.teradyne.com\/teststation-features-options\/\"\u003eView all TestStation Features \u0026amp; Options\u003c\/a\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"ult-spacer spacer-6a170e8959ad3\" data-id=\"6a170e8959ad3\" data-height=\"10\" data-height-mobile=\"10\" data-height-tab=\"10\" data-height-tab-portrait=\"\" data-height-mobile-landscape=\"\"\u003e\u003cbr\u003e\u003c\/div\u003e\n\u003cdiv class=\"ult-spacer spacer-6a170e8959ae2\" data-id=\"6a170e8959ae2\" data-height=\"10\" data-height-mobile=\"10\" data-height-tab=\"10\" data-height-tab-portrait=\"\" data-height-mobile-landscape=\"\"\u003e\u003cbr\u003e\u003c\/div\u003e\n\u003cdiv class=\"ult-spacer spacer-6a170e8959aeb\" data-id=\"6a170e8959aeb\" data-height=\"10\" data-height-mobile=\"10\" data-height-tab=\"10\" data-height-tab-portrait=\"\" data-height-mobile-landscape=\"\"\u003e\u003cbr\u003e\u003c\/div\u003e\n\u003cdiv class=\"ult-spacer spacer-6a170e8959af4\" data-id=\"6a170e8959af4\" data-height=\"10\" data-height-mobile=\"10\" data-height-tab=\"10\" data-height-tab-portrait=\"\" data-height-mobile-landscape=\"\"\u003e\u003cbr\u003e\u003c\/div\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element nitro-offscreen\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003ch3\u003e\u003cstrong\u003eAvailable Configurations\u003c\/strong\u003e\u003c\/h3\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"ult-spacer spacer-6a170e8959b48\" data-id=\"6a170e8959b48\" data-height=\"10\" data-height-mobile=\"10\" data-height-tab=\"10\" data-height-tab-portrait=\"\" data-height-mobile-landscape=\"\"\u003e\u003cbr\u003e\u003c\/div\u003e\n\u003cdiv class=\"wpb_text_column wpb_content_element nitro-offscreen\"\u003e\n\u003cdiv class=\"wpb_wrapper\"\u003e\n\u003cp data-start=\"1285\" data-end=\"1333\"\u003e\u003cstrong data-start=\"1285\" data-end=\"1331\"\u003eTestStation\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul data-start=\"1335\" data-end=\"1648\"\u003e\n\u003cli data-start=\"1335\" data-end=\"1420\"\u003e\n\u003cp data-start=\"1337\" data-end=\"1420\"\u003e\u003cstrong data-start=\"1337\" data-end=\"1375\"\u003eSingle-Site (Test Insert Model 51)\u003c\/strong\u003e: Up to 5 pin boards, 640–2,560 test points\u003c\/p\u003e\n\u003c\/li\u003e\n\u003cli data-start=\"1421\" data-end=\"1528\"\u003e\n\u003cp data-start=\"1423\" data-end=\"1528\"\u003e\u003cstrong data-start=\"1423\" data-end=\"1460\"\u003eMulti-Site (Test Insert Model 52)\u003c\/strong\u003e: Up to 10 pin boards (5 per site), 640–2,560 test points per site\u003c\/p\u003e\n\u003c\/li\u003e\n\u003cli data-start=\"1529\" data-end=\"1599\"\u003e\n\u003cp data-start=\"1531\" data-end=\"1599\"\u003eSupports analog-only, pure-pin, hybrid, and high-density pin cards\u003c\/p\u003e\n\u003c\/li\u003e\n\u003cli data-start=\"1600\" data-end=\"1648\"\u003e\n\u003cp data-start=\"1602\" data-end=\"1648\"\u003eCompatible with existing Multi-Site fixtures\u003c\/p\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp data-start=\"1650\" data-end=\"1688\"\u003e\u003cstrong data-start=\"1650\" data-end=\"1686\"\u003eTestStation Large Format\u003c\/strong\u003e\u003c\/p\u003e\n\u003cul data-start=\"1690\" data-end=\"1816\"\u003e\n\u003cli data-start=\"1690\" data-end=\"1779\"\u003e\n\u003cp data-start=\"1692\" data-end=\"1779\"\u003e\u003cstrong data-start=\"1692\" data-end=\"1731\"\u003eSingle-Site (Test Insert Model 161)\u003c\/strong\u003e: Up to 16 pin boards, 2,048–6,144 test points\u003c\/p\u003e\n\u003c\/li\u003e\n\u003cli data-start=\"1780\" data-end=\"1816\"\u003e\n\u003cp data-start=\"1782\" data-end=\"1816\"\u003eSupports UUTs up to 530 × 508 mm\u003c\/p\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"Teradyne","offers":[{"title":"Default Title","offer_id":53217227899177,"sku":null,"price":0.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0738\/4665\/3225\/files\/test-station-handler.webp?v=1780064869"}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0738\/4665\/3225\/collections\/Teradyne-Omnyx-030526-short.webp?v=1780065000","url":"https:\/\/assembly-products.com\/collections\/teradyne-inline-platforms-built-for-modern-manufacturing.oembed","provider":"Assembly Products","version":"1.0","type":"link"}